UCC5870QEVM-045

UCC5870QEVM-045 Gate Driver Evaluation Module

Texas Instruments UCC5870QEVM-045 Gate Driver Evaluation Module (EVM) is designed for the evaluation of TI’s 15A isolated single-channel gate driver with advanced protection features. This evaluation module is targeted to drive high-power SiC MOSFETs and IGBTs in EV/HEV applications. This three-phase evaluation module can be used for debugging software for the driver’s serial peripheral interface (SPI). It can also explore the driver’s sophisticated diagnostic, protection, and monitoring features. Texas Instruments UCC5870QEVM-045 is designed to test six channels of the UCC5870-Q1 gate drivers with TI address mode SPI communication. It also has the option to configure the board for daisy chain mode SPI communication. The board can directly fit C2000 LaunchPad LAUNCHXL-F28379D, but also provides connectors for other types of controllers.